| AVS 60th International Symposium and Exhibition | |
| Scanning Probe Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| SP+AS+BI+NS-ThP1 Vision Sensing Based Drift Measurement and Compensation in Real Time for Atomic Force Microscope Y. Wang, Beihang University, China, H. Wang, The Ohio State University, S. Bi, Beihang University, China |
| SP+AS+BI+NS-ThP2 Rapid Near-Field Infrared Spectroscopy Using an External Cavity Quantum Cascade Laser I.M. Craig, M.S. Taubman, M.C. Phillips, A.S. Lea, Pacific Northwest National Laboratory, M.B. Raschke, University of Colorado at Boulder |
| SP+AS+BI+NS-ThP3 Ferritin-based Magnetic Force Microscopic Probe with Very High Resolution N. Chung, Korea Research Institute of Standards and Science, Republic of Korea, D.H. Kim, J.W. Park, Pohang University of Science and Technology, Republic of Korea |