| AVS 60th International Symposium and Exhibition | |
| Synchrotron Analysis Focus Topic | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| SA-TuP1 Mesoscale and Microstructural Changes in HMX Measured with Synchrotron-Based USAXS and Microtomography T.M. Willey, L. Lauderbach, T.W. van Buuren, I.C. Tran, Lawrence Livermore National Laboratory, J. Ilavsky, Argonne National Laboratory, H.K. Springer, Lawrence Livermore National Laboratory |
| SA-TuP4 Grazing Incidence X-ray Fluorescence Analysis for the Characterization of Ge1-xSnx Thin Films P. Hönicke, Physikalisch-Technische Bundesanstalt, Germany, C. Fleischmann, IMEC, Belgium, P. Hermann, Physikalisch-Technische Bundesanstalt, Germany, S. Zaima, Nagoya University, Japan, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Germany, O. Nakatsuka, Nagoya University, Japan |