| AVS 60th International Symposium and Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| EL-ThP2 Electronic and Vibrational Properties of Nickel Oxide using Spectroscopic Ellipsometry C.M. Nelson, T. Willett-Gies, L.S. Abdallah, S. Zollner, New Mexico State University |
| EL-ThP3 Properties of Sm Doped CeO2 Thin Films Prepared by Liquid Solution Deposition K.N. Mitchell, C.A. Rodriguez, T. Willett-Gies, Y. Li, S. Zollner, New Mexico State University |