AVS 60th International Symposium and Exhibition
    In Situ Spectroscopy and Microscopy Focus Topic Thursday Sessions
       Session IS+EN+SP+SS-ThA

Paper IS+EN+SP+SS-ThA2
Ex Situ Lift-Out of Specimens for In Situ TEM Studies

Thursday, October 31, 2013, 2:20 pm, Room 203 B

Session: In Situ Studies of Electrochemical Interfaces and Processes
Presenter: L.A. Giannuzzi, L.A. Giannuzzi & Associates LLC
Authors: L.A. Giannuzzi, L.A. Giannuzzi & Associates LLC
Z. Yu, Lehigh University
M.P. Harmer, Lehigh University
Correspondent: Click to Email
In-situ transmission electron microscopy (TEM) of grain boundaries at elevated temperature requires accurate manipulation of electron transparent specimens to site-specific carbon films patterned on heating membranes measuring only ~5-10 micrometers in diameter. Ex-situ lift-out (EXLO) of focused ion beam (FIB) prepared or other electron transparent specimens (e.g., fibers, particles, platelet precipitates) is advantageous for accurate manipulation of specimens to these membranes because it is fast, reproducible, and avoids deleterious ion implantation into the specimens while FIB imaging during the in-situ lift-out method. The ex-situ lift-out technique for this application will be described and in-situ TEM results will be presented.