| AVS 60th International Symposium and Exhibition | |
| In Situ Spectroscopy and Microscopy Focus Topic | Thursday Sessions |
| Session IS+AS+SS-ThM |
| Session: | Ambient Pressure XPS from Sophistication to Reality |
| Presenter: | Z. Liu, Lawrence Berkeley National Laboratory |
| Authors: | S. Axnanda, Lawrence Berkeley National Laboratory E.J. Crumlin, Lawrence Berkeley National Laboratory R. Chang, Lawrence Berkeley National Laboratory B. Mao, Lawrence Berkeley National Laboratory W. Stolte, Lawrence Berkeley National Laboratory P. Ross, Lawrence Berkeley National Laboratory Z. Hussain, Lawrence Berkeley National Laboratory Z. Liu, Lawrence Berkeley National Laboratory |
| Correspondent: | Click to Email |
The ambient pressure x-ray photoelectron spectroscopy (AP-XPS) endstations based on differentially pumped electron energy analyzers have been recognized by scientific communities as an important in-situ tool to study water, environmental science, catalysis and many other important fields.
Multiple new AP-XPS endstations are currently under planning or development at US and international synchrotron light sources. Recently we have installed a new hard x-ray AP-XPS endstation at ALS Beamline 9.3.1 (2.5keV- 5keV). By using tender X-ray up to 5KeV, we can perform AP-XPS at a pressure up to 110 torr. The probing depth of photoelectrons also increases to >10 nm, which will allow us to study not only the gas/solid interface but also the liquid/solid interface. In this meeting, we will present results of our in-situ study on the electrolyte/electrode interface of a working model electrochemical cell.
We believe the successful development of hard X-ray APXPS endstation will provide energy research community a powerful in-situ tool to directly study the electrolyte/electrode interface of many important electrochemical devices.