| AVS 60th International Symposium and Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS+BI-TuA |
| Session: | Forensic Science, Art and Archaeology (2:00-3:20 pm)/Quasicrystals and Complex Metal Alloys (4:00-6:00 pm) |
| Presenter: | P.A. Thiel, Ames Laboratory and Iowa State University |
| Authors: | B. Ünal, Massachusetts Institute of Technology J.W. Evans, Ames Laboratory and Iowa State University P.A. Thiel, Ames Laboratory and Iowa State University |
| Correspondent: | Click to Email |
The morphology of thin metal films deposited on metal substrates is often dominated by kinetic rather than thermodynamic factors . These factors can assessed by studying film characteristics as a function of deposition temperature. In this study, we report a comparison of the roughness of thin Ag films deposited on surfaces of a quasicrystal (five-fold icosahedral Al-Pd-Mn), an approximant of this quasicrystal, and low-index Ag surfaces, at temperatures below and up to ambient. Kinetic effects lead to an increase in roughness with increasing temperature for the Al-Pd-Mn substrates, but a decrease in roughness over the same range on Ag(111) and Ag(100). The nature of these effects is discussed. In addition, we observe that interlayer spacings in the film depend upon layer height, for the Al-Pd-Mn substrates. A useful refined definition of roughness for a system with variable interlayer spacing is addressed.