AVS 59th Annual International Symposium and Exhibition
    Vacuum Technology Tuesday Sessions
       Session VT-TuP

Paper VT-TuP2
Pressure Effects in Autoresonant Ion Trap Mass Spectrometers (ARTMS)

Tuesday, October 30, 2012, 6:00 pm, Room Central Hall

Session: Vacuum Technology Poster Session and Student-built Vacuum System Poster Competition
Presenter: P. Acomb, Brooks Automation, Inc., Granville-Phillips Products
Authors: P. Acomb, Brooks Automation, Inc., Granville-Phillips Products
G.A. Brucker, Brooks Automation, Inc., Granville-Phillips Products
J. Rathbone, Brooks Automation, Inc., Granville-Phillips Products
Correspondent: Click to Email
Autoresonant ion trap mass spectrometers (ARTMS) are gaining rapid acceptance in the vacuum market both as residual gas analyzers as well as process gas monitors. During the course of routine analysis, most ARTMS instruments are required to provide accurate analytical results over a wide range of total pressures and gas compositions. Since the performance of ion traps is pressure dependent, it is important to understand how total pressure impacts gas analysis results and to understand the methodologies available to adjust operational parameters based on present pressure conditions. Important performance specifications that are affected by total pressure conditions include baseline offset, resolving power, sensitivity, dynamic range and fragmentation patterns. The pressure-related physical phenomena presently known to impact ion trap performance are identified and associated to the specific pressure ranges at which they are relevant. The ion trap operational parameters available to the user to optimize trap performance as a function of total pressure are explained. Vacuum practitioners presently using ARTMS instruments for gas analysis can quickly, easily and dynamically apply the concepts introduced in this poster to optimize the performance of their gas monitors as a function of total pressure conditions.