| AVS 59th Annual International Symposium and Exhibition | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
| Session NS+EN+GR-TuA |
| Session: | Nanomaterials in Two and Three Dimensions |
| Presenter: | J.H. Kim, Sungkyunkwan University, Republic of Korea |
| Authors: | J.H. Kim, Sungkyunkwan University, Republic of Korea H.K. Cho, Sungkyunkwan University, Republic of Korea |
| Correspondent: | Click to Email |
As the materials currently in use have been reached terminal and showed low productivity in a few field, the development of advanced materials are demanded. In the middle of atmosphere, low-dimensional nanostructures have been introduced in recent studies such as 1-D nanowire and 2-D superlattice. Among them, a multi-layered structure shows unique properties originating from the confinement of carriers in the two-dimensional layer. For example, LaFeO3-LaCrO3 superlattice structures fabricated by pulsed layer deposition (PLD) have shown enhanced ferromagnetism [1] and InGaO3(ZnO)m superlattice structure grown by sputtering method has improved thermoelectric properties [2].
These homologous series of RAO3(MO)m (R=In or rare earth elements; A=Ga, In, Al, or Fe ; M=Mg, Co, Cu, or Zn ; m=integer) comprise alternating stacks of RO2- and AO+(MO)m layers and are candidate to exhibit the quantum effect due to its natural superlattice [3]. Despite these materials being widely investigated, the fabrication of RAO3(MO)m thin film with layerd structure is limit due to their fabrication which requires expensive high-vacuum equipment and shows low productivity.
In this study, all solution process (an epitaxial ZnO buffer layer growth on sapphire substrate, amorphous IGZO layer on ZnO buffer layer by composition controlled solution process, and post-annealing at 900˚C for 9hours) enables us to fabricate InGaO3(ZnO)m thin film with periodic superlattice structure. Crystallinity of thin film was analyzed by X-ray diffraction and TEM results. And also, TE properties such as Seebeck coefficient, electrical conductivity, thermal conductivity were evaluated to identify the degree of crystallization of superlattice with layered structure.
Reference
[1] K. Ueda, H. Tabata and T. Kawai, Science, 1998, 280, 1064
[2] D. K. Seo, B. H. Kong and H. K. Cho, Cryst. Growth Des., 2010, 10, 4638
[3] J. L. F. Da Silva, Y. F. Yan and S. H. Wei, Physical Review Letters, 2008, 100, 255501.