AVS 59th Annual International Symposium and Exhibition
    Magnetic Interfaces and Nanostructures Thursday Sessions
       Session MI+SP+AS-ThM

Invited Paper MI+SP+AS-ThM9
Polarized Neutron Reflectometry on Exchange Biased Thin Films

Thursday, November 1, 2012, 10:40 am, Room 006

Session: Emerging Probes in Magnetic Imaging, Reflectometry and Characterization
Presenter: K. Temst, KU Leuven, Belgium
Correspondent: Click to Email

Polarized neutron reflectivity has established itself as an important tool in the study of magnetic thin film systems. It provides a high-resolution magnetic depth profile and it offers vectorial probing of the magnetization. In recent years polarized neutron reflectivity has played an influential role in elucidating the magnetic structure of exchange bias systems, i.e. structures in which a ferromagnetic layer is coupled to an antferromagnetic layer. Exchange bias leads to a remarkable shift of the hysteresis loop, an increase in coercivity, and often a pronounced asymmetry of the hysteresis loop shape as wellas a complex magnetic history. With this contribution we will take a closer look at two such exchange bias systems and highlight the role of polarized neutron reflectivity.

As a first model system, the archetypal exchange bias system Co/CoO will be highlighted. The antiferromagnetic CoO layer is prepared by oxidizing the surface of a Co thin film, by exposing it to a reduced oxygen atmosphere. We will review the properties of exchange bias in surface-oxidized Co thin films, with the emphasis on the asymmetry of the magnetization reversal mechanism and the training effect. We will also discuss how the training effect can be (partially) restored by applying a magnetic field perpendicular to the initial cooling field direction. Recently we explored an alternative way to establish exchange bias between Co and CoO: rather than creating the antiferromagnetic CoO layer by oxidizing a metallic Co layer, the antiferromagnetic CoO is produced by implantation of oxygen ions into a Co layer. Polarized neutron reflectivity (PNR) is used to determine the magnetic depth profile and to probe the magnetization reversal mechanism. Simultaneously with the PNR measurements, in situ anisotropic magnetoresistance measurements were carried out.

The second example is a ferromagnet/antiferromagnet FePt/FePt3 bilayer in which complementary use is made of polarized neutron reflectivity (for studying the magnetic depth profile in the ferromagnetic layer) and nuclear resonant scattering of synchrotron x-rays (making use of the Mössbauer effect) to probe the antiferromagnetic FePt3 layer. Below the Néel temperature, antiferromagnetic order appears in the FePt3 layer with a spin wavevector pointing along the [100] axis. A net magnetization of the FePt3, which increases towards the FePt/FePt3 interface is found.

This work was supported by the Fund for Scientific Research-Flanders (FWO), the KULeuven Concerted Research Action program (GOA/09/006), the Belgian Interuniversity Attraction Poles research programs (IAP P6/42), and the KULeuven BOF (CREA/07/005) program.