| AVS 59th Annual International Symposium and Exhibition | |
| Magnetic Interfaces and Nanostructures | Thursday Sessions |
| Session MI+SP+AS-ThM |
| Session: | Emerging Probes in Magnetic Imaging, Reflectometry and Characterization |
| Presenter: | R.A. Rosenberg, Argonne National Laboratory |
| Authors: | R.A. Rosenberg, Argonne National Laboratory S. Zohar, Argonne National Laboratory D. Keavney, Argonne National Laboratory A. Mascarenhas, National Renewable Energy Laboatory M. Steiner, National Renewable Energy Laboatory D. Rosenmann, Argonne National Laboratory R.S. Divan, Argonne National Laboratory |
| Correspondent: | Click to Email |
We have developed an imaging technique based on x-ray excited luminescence microscopy (XELM), that will enable elemental and magnetic specific imaging of a wide range of materials such as those used in solar cells, magnetic materials, spintronic devices, ferroelectrics, and solid-state lighting. This new scientific tool utilizes the benefits of pulsed, polarized, tunable synchrotron radiation excitation with microscopic detection of the resulting optical emission. A unique offshoot of the microscope is the ability to perform element specific magnetic microscopy of micron-sized features or domains in magnetic fields. X-rays transmitted through thin films are attenuated and the resultant absorption spectrum can be determined by changes in the substrate luminescence. Since many substrates, such as SrTiO3 and GaAs, used in thin film growth have intense optical emission, this tool should impact many materials where photoelectron emission microscopy (PEEM) cannot be performed since it is not useable on insulating materials or if magnetic or electric fields are required. This approach will be especially useful at low temperatures where luminescence yields are highest, and PEEM has difficulties. In this presentation we will present some initial results from the microscope on some prototype solar cell materials and lithographically patterned Permalloy/GaAs and Permalloy/Cu/Co/GaAs samples. The results demonstrate the potential of XELM for elemental and magnetic specific imaging.
This work was performed at the Center for Nanoscale Materials and the Advanced Photon Source. It was supported by the U.S. Department of Energy, Office of Science and Office of Basic Energy Sciences under the contract number DE-AC02-06CH11357 and by the Department of Energy, Energy Efficiency and Renewable Energy, Solid State Lighting Program.