Invited Paper MI+SP+AS-ThM1
Toward Microscopy with Direct Chemical and Magnetic Contrast at the Atomic Level
Thursday, November 1, 2012, 8:00 am, Room 006
In this talk we will discuss the development of a novel high-resolution microscopy technique for imaging of nanoscale materials with chemical, electronic, and magnetic contrast. It will combine the sub-nanometer spatial resolution of scanning tunneling microscopy (STM) with the chemical, electronic, and magnetic sensitivity of synchrotron radiation. [1] Drawing upon experience from a prototype that has been developed to demonstrate general feasibility, current work has the goal to drastically increase the spatial resolution of existing state-of-the-art x-ray microscopy from only tens of nanometers down to atomic resolution. The technique will enable fundamentally new methods of characterization, which will be applied to the study of energy materials and nanoscale magnetic systems. A better understanding of these phenomena at the nanoscale has great potential to improve the conversion efficiency of quantum energy devices and lead to advances in future data storage applications. The combination of the high spatial resolution of STM with the energy selectivity afforded by x-ray absorption spectroscopy provides a powerful analytical tool.Work at the Advanced Photon Source, the Center for Nanoscale Materials, and the Electron Microscopy Center was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract DE-AC02-06CH11357.
[1] V. Rose, J.W. Freeland, S.K. Streiffer, “New Capabilities at the Interface of X-rays and Scanning Tunneling Microscopy”, in Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy, S.V. Kalinin, A. Gruverman, (Eds.), Springer, New York (2011), pg 405-432.