AVS 59th Annual International Symposium and Exhibition
    Graphene and Related Materials Focus Topic Thursday Sessions
       Session GR+EM+NS+SS+TF-ThA

Paper GR+EM+NS+SS+TF-ThA6
Formation of Silicene and 2D Si Sheets on Ag(111): Growth Mode, Structural and Electronic Properties

Thursday, November 1, 2012, 3:40 pm, Room 13

Session: Beyond Graphene: BN and Other 2D Electronic Materials; 2D Heterostructures
Presenter: P. Vogt, Technical University of Berlin, Germany
Authors: P. Vogt, Technical University of Berlin, Germany
T. Bruhn, CNRS CiNaM, Marseille, France
A. Resta, CNRS CiNaM, Marseille, France
B. Ealet, CNRS CiNaM, Marseille, France
P. De Padova, CNR-ISM, Rome, Italy
G. Le Lay, CNRS CiNaM, Marseille, France
Correspondent: Click to Email

Since the discovery of graphene enormous efforts have been invested to discover other similar 2-dimensional materials, like e.g. silicene. These 2D materials share similar structural, electronic and optical properties as graphene but are expected to differ in terms of their respective chemical reactivity and thus their applicability for electronic devices. In particular silicene could more easily be integrated into current Si-based electronics than graphene. Silicene has been predicted theoretically [1,2] but does not seem to exist in nature.
Recently, we could synthesize silicone layers grown epitaxially by depositing Si on Ag(111) surfaces. The electronic properties of these silicene layers were shown to behave as theoretically predicted [3] and the structural and electronic properties are very similar to graphene. In STM images the hexagonal 2D silicone sheet gives rise to triangular structures situated in a honeycomb arrangement with (4×4) symmetry with respect to the Ag(111) surface. A structural model derived from the STM measurements showed a very good agreement with DFT results and exhibited a downward conical electronic dispersion resembling that of relativistic Dirac fermions at the Si K-points [3]. Depending on the growth conditions the formation of different 2D silicon arrangements can be observed: 1) Si-clusters at low deposition temperatures, 2) the formation of less ordered 2D hexagonal Si-based structures at temperatures up to 180°C, 3) the formation of the (4×4) silicene sheet around 220°C and 4) a 2D Si structure with a (√13×√13)-like periodicity at higher growth temperatures exhibiting a very regular, wide range ordered Moiré-like surface pattern in STM.
Here, we will discuss the formation and epitaxial growth mode of these different 2D Si structures and the dependence on the growth parameters. We will also investigate whether these different 2D Si layers all refer to similar silicene sheets which give rise to different appearances in STM due to a varying rotation with respect to each other.
Keywords: silicene, 2D materials, graphene, Dirac fermions
References:
[1] S. Cahangirov et al., Phys. Rev. Lett. 102, 236804 (2009)
[2] G. G. Guzman-Verri and L. C. Lew Yan Voon, Phys. Rev. B 76, 75131 (2007)
[3] P. Vogt et al.,Phys. Rev. Lett. 108, 155501 (2012)