AVS 59th Annual International Symposium and Exhibition
    Electron Transport at the Nanoscale Focus Topic Friday Sessions
       Session ET+SS+GR+SP-FrM

Paper ET+SS+GR+SP-FrM5
Understanding the Influence of the Tunneling Current and the Chemical Force on the Contrast Formation in KPFM

Friday, November 2, 2012, 9:40 am, Room 16

Session: Electron Transport at the Nanoscale: Development of Theories and Techniques
Presenter: Z. Majzik, Institute of Physics of ASCR, Czech Republic
Authors: Z. Majzik, Institute of Physics of ASCR, Czech Republic
M. Ondráček, Institute of Physics of ASCR, Czech Republic
M. Švec, Institute of Physics of ASCR, Czech Republic
J. Berger, Institute of Physics of ASCR, Czech Republic
P. Jelínek, Institute of Physics of ASCR, Czech Republic
Correspondent: Click to Email

Kelvin Probe Force Microscopy (KPFM) [1] senses the variation in the electrostatic force. The electrostatic force is Fel=-dCTS/dz(Vbias-Vlcpd)2, where Vlcpd denotes to the local contact potential difference (LCPD). Atomic scale resolution was achieved by KPFM on the prototypical Si(111)–7×7 surface [2]. It was shown that the formation of a chemical bond between the closest tip-surface atoms induces significant variation in the LCPD [2]. Lately it was observed that the tunneling current leads to the raise of an additional electrostatic (phantom) force [3]. Consequently, the total electrostatic force must be the combination of several components where the contribution of each component is defined by the tip-sample separation.
Recent progress in Scanning Probe Microscopy opens the possibility of simultaneous acquisition of the tunneling current, atomic forces and local potential difference with atomic resolution [4]. The aim of this contribution is to discuss the origin of electrostatic force contribution at different tip-sample separations. In particular, we performed simultaneous site-specific AFM/STM measurements on Si(111)–7×7 using a modified Omicron qPlus (tuning fork based) system [5]. We found that along the tip approach three characteristic regions can be well distinguished. At large tip-sample separations, the capacitance is a function of tip geometry and the tip-sample distance. Approaching the tip closer towards the surface, quantum effects become to play important role. The overlap between the tip and sample wave functions produces electron tunneling, which induces additional electrostatic force. Formation of the chemical interaction between the tip apex atom and the adatoms of the 7x7 surface induces changes in the electron charge distribution reflected in variation of the LCPD [2] and the permittivity in the tunneling gap. Hence the capacitance is modified accordingly. In order to have better understanding of the impact of the chemical interaction, atomic hydrogen was deposited to saturate the dangling bonds of adatoms. Over the hydrogenated adatoms, nor strong shift in the LCPD or sudden change in the capacitance was observed. Further to gain more insight into ongoing processes we carried out DFT calculations for tip-sample interaction to understand affect of the formation of covalent bond between tip apex and surface adatoms on the Si 7x7 surface.
References
[1] M. Nonnenmacher et. al, App. Phys. Lett. 58, 2921 (1991)
[2] S. Sadewasser et. al, Phys. Rev. Lett. 103, 266103 (2009)
[3] A. J. Weymouth et. al, Phys. Rev. Lett. 106, 226801 (2011)
[4] F.J. Giessibl, Appl. Phys. Lett. 73, 3956 (1998)
[5] Z. Majzik et. al. B. J. Nano 249, 3 (2012)