AVS 58th Annual International Symposium and Exhibition
    Applied Surface Science Division Thursday Sessions

Session AS-ThM
Analysis of Insulators and Challenging Samples

Thursday, November 3, 2011, 8:00 am, Room 102
Moderator: Daniel J. Gaspar, Pacific Northwest National Laboratory


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am AS-ThM1
Imaging and Differentiation of Epicuticular Waxes on Arabidopsis thaliana Organs by TOF-SIMS
Gregory Fisher, Physical Electronics, P. Wong, C. Buschhaus, R. Jetter, University of British Columbia, Canada
8:20am AS-ThM2
Aqueous SIMS – Towards in Situ Detection of Chemical Reaction Intermediates in Aqueous Solutions
Zihua Zhu, L. Yang, X. Yu, M.J. Iedema, J.P. Cowin, Pacific Northwest National Laboratory
8:40am AS-ThM3
Challenges of the XPS Analysis of the Ionic Liquid [BMIM][PF6]
Robert R. Harl, B.D. Booth, G.K. Jennings, B.R. Rogers, Vanderbilt University
9:00am AS-ThM4 Invited Paper
Working with Difficult Samples - Preparation, Damage, Charging and Data Analysis
Don Baer, M.H. Engelhard, A.S. Lea, P. Nachimuthu, Z. Zhu, Pacific Northwest National Laboratory
10:40am AS-ThM9
Transient Electron Emission from Insulators under Pulsed Electron Beam Injection
Yoshinobu Kimura, H. Koyama, H. Makino, H. Shinada, Hitachi, Ltd., Japan, Y. Mochizuki, H. Kazumi, Hitachi High-Technologies Corp., Japan
11:00am AS-ThM10
High Resolution XPS Chemical State Imaging of Fuel Cell Membranes
Sankar Raman, P.E. Larson, J. Moulder, J.S. Hammond, S. Alnabulsi, Physical Electronics USA
11:20am AS-ThM11
Gas-Cluster Ion Beam Secondary Ion Mass Spectrometry Characterization of Thin Films for Organic Electronics Applications
Daniel J. Gaspar, Pacific Northwest National Laboratory, S.R. Bryan, Physical Electronics USA, T. Miyayama, ULVAC-PHI, Japan, A.B. Padmaperuma, J.S. Swensen, E. Polikarpov, Pacific Northwest National Laboratory