AVS 58th Annual International Symposium and Exhibition
    Vacuum Technology Division Tuesday Sessions
       Session VT+MN+NS+SS+AS-TuA

Paper VT+MN+NS+SS+AS-TuA7
Examples of Surface Related R&D on Nb Samples and SRF Cavities for Particle Accelerators at JLab

Tuesday, November 1, 2011, 4:00 pm, Room 111

Session: Surface Science for Future Electronic Materials and Accelerator Applications
Presenter: Andy Wu, Thomas Jefferson National Accelerator Facility
Correspondent: Click to Email

This contribution will review some examples of surface related R&D on small and flat niobium (Nb) samples and single cell Nb superconducting radio frequency (SRF) cavities done at Jefferson Lab in the past few years. Most of the surface measurements were performed via the experimetal systems available in the surface science lab that was set up1 at JLab to study the various problems on the Nb surfaces in the SRF field.

The first topic is about a new Nb surface polsihed technique called buffered electropolishing (BEP) that was developed at JLab2. This technique can produce the smoothest surface finish ever reported in the literature3. It was also demonstrated that under a suitable condition, a Nb removal rate higher than 10 µm/min could be realized. Efforts have been made to try to understand the polishing mechanism through experiments with a well defined experimental geometry on small flat Nb samples. A unique versatile vertical polishing system was constructed to perform BEP on Nb single cell cavities. Small flat samples, Nb dumbbells and Nb single cell cavities were also studied and treated at CEA Saclay in France and Peking Universty in China and the cavities were RF tested at JLab. Experimental results will be analyzed and summarized. It is showed that BEP is a very promising cadidate for the next generation surface polishing technique for Nb SRF cavites.

A second topic will deal with a new Nb surface cleaning technique employed gas cluster ion beam (GCIB)4. This is a result of collaboration with Epion Corporation, Fermi Lab, and Argonne Lab. Beams of Ar, O2, N2, and NF3 clusters with accelerating voltages up to 35 kV were employed in this technique to bombar on Nb surfaces. The treated surfaces of Nb flat samples were examined by sevral surface experimental systems such as SEM, EDX, AFM, SIMS, and 3-D profilometer. The experiments revealed that GCIB technique could not only modify surface morphology of Nb, but also change the surface oxide layer structure of Nb and reduce the number of field emission sites on the surface dramatically. Computer simulation via atomistic molecular dynamics and a phenomenological surface dynamics was employed to help understand the experimental results. A system was set-up at Epion Corporation to do treatments on Nb single cell cavities and then RF-tested at JLab. The experimental results will be summarized and the perspective of this technique for real appliactions is discussed.

Finally, I will show two typical examples of surface studies of Nb using a high resultion transmission electron microscope5 and a home-made scanning field emission microscope6 respectively.