| AVS 58th Annual International Symposium and Exhibition | |
| Vacuum Technology Division | Tuesday Sessions |
| Session VT+MN+NS+SS+AS-TuA |
| Session: | Surface Science for Future Electronic Materials and Accelerator Applications |
| Presenter: | Joseph Stroscio, National Institute of Standards and Technology |
| Correspondent: | Click to Email |
Since the beginning of the last century new frontiers in physics have emerged when advances in instrumentation achieved lower experimental operating temperatures. Notable examples include the discovery of superconductivity and the integer and fractional quantum Hall effects. New experimental techniques are continually adapted in order to meet new experimental challenges. A case in point is scanning tunneling microscopy (STM) which has seen a wealth of new measurements emerge as cryogenic STM instruments have been developed in the last two decades. In this talk I describe the design, development and performance of a scanning probe microscopy facility operating at a base temperature of 10 mK in magnetic fields up to 15 T [1]. The STM system can be connected to, or disconnected from, a network of interconnected auxiliary UHV chambers used for sample and probe tip preparation. Results from current measurements on graphene and topological insulators will be described.
[1] A 10 mK Scanning Probe Microscopy Facility, Y. J. Song, A. F. Otte, V. Shvarts, Z. Zhao, Y. Kuk, S. R. Blankenship, A. Band, F. M. Hess, and J. A. Stroscio, Rev. Sci. Instrum. 81, 121101 (2010).