| AVS 58th Annual International Symposium and Exhibition | |
| In Situ Spectroscopy and Microscopy Focus Topic | Monday Sessions |
| Session IS+AS+SS-MoA |
| Session: | In Situ Characterization of Solids: Film Growth, Defects, and Interfaces |
| Presenter: | Andreas Thissen, SPECS Surface Nano Analysis GmbH, Germany |
| Correspondent: | Click to Email |