AVS 58th Annual International Symposium and Exhibition | |
In Situ Spectroscopy and Microscopy Focus Topic | Monday Sessions |
Session IS+AS+SS-MoA |
Session: | In Situ Characterization of Solids: Film Growth, Defects, and Interfaces |
Presenter: | Andreas Thissen, SPECS Surface Nano Analysis GmbH, Germany |
Correspondent: | Click to Email |