AVS 57th International Symposium & Exhibition
    Electronic Materials and Processing Tuesday Sessions

Session EM-TuA
Defects in Semiconductors and Oxides

Tuesday, October 19, 2010, 2:00 pm, Room Dona Ana
Moderator: J. Drucker, Arizona State University


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm EM-TuA1 Invited Paper
Influence of N-induced Point Defects on the Electronic Properties of Dilute Nitride GaAsN Alloys
Y. Jin, R.M. Jock, H. Cheng, C. Kurdak, R.S. Goldman, University of Michigan
2:40pm EM-TuA3 Invited Paper
Identification of the Dominant Recombination Centers in Dilute Nitrides
I.A. Buyanova, M. Chen, Linköping University, Sweden
4:00pm EM-TuA7
Band Bending and Surface Defects in Ga2O3
T.C. Lovejoy, R. Chen, S.X. Zheng, University of Washington, E.G. Villora, K. Shimamura, H. Yoshikawa, Y. Yamashita, NIMS, Japan, S. Ueda, K. Kobayashi, SPring-8, Japan, S. Dunham, F.S. Ohuchi, M.A. Olmstead, University of Washington
4:40pm EM-TuA9
Control of Oxygen Diffusion in Titanium Dioxide for Nanoelectronic Applications
A. Hollister, P. Gorai, E.G. Seebauer, University of Illinois at Urbana-Champaign
5:00pm EM-TuA10
Effect of Vacuum Ultraviolet and Ultraviolet Irradiation on Capacitance-Voltage Characteristics of Low-k-porous Organosilicate Dielectrics
H. Sinha, J. Lauer, M. Nichols, A. Sehgal, University of Wisconsin-Madison, N.M. Russell, M. Tomoyasu, Tokyo Electron Limited, G.A. Antonelli, Novellus Systems, Inc., Y. Nishi, Stanford University, J.L. Shohet, University of Wisconsin-Madison
5:20pm EM-TuA11
Effect of Strain Relaxation on Electron Mobility in InAs/GaAs Nanowire Heterowires
K.L. Kavanagh, Simon Fraser University, Canada, J. Salfi, I. Saveliev, University of Toronto, Canada, D. Susac, Simon Fraser University, Canada, M. Blumin, H. Ruda, University of Toronto, Canada