| AVS 57th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | EL+AS+EM+MS+TF-ThA1 Invited Paper Developments in Spectroscopic Ellipsometry for Characterization of Organic and Inorganic Surfaces, Interfaces and Complex Layered Materials M. Schubert, University of Nebraska - Lincoln |
| 2:40pm | EL+AS+EM+MS+TF-ThA3 Characterizing the Adsorption – Desorption Behavior of Organic Molecules Within Thin Mesoporous Carbon Composite Films using Spectroscopic Ellipsometry B.D. Vogt, L.Y. Song, M.Z. Dai, Arizona State University |
| 3:00pm | EL+AS+EM+MS+TF-ThA4 Mueller-Matrix Ellipsometry Studies of Chirality in Chitin-Based Structures and Thin Films of Al1-xInxN K. Järrendahl, H. Arwin, R. Magnusson, P. Sandström, C.-L. Hsiao, J. Landin, S. Valyukh, J. Birch, Linköping University, Sweden |
| 3:40pm | EL+AS+EM+MS+TF-ThA6 Mueller Polarimetry as a Tool for the Evaluation of the Diffraction Grating Profile Asymmetry T. Novikova, P. Bulkin, LPICM, CNRS, Ecole Polytechnique, France, V. Popov, Moscow State University, Russia, A. De Martino, LPICM, CNRS, Ecole Polytechnique, France |
| 4:00pm | EL+AS+EM+MS+TF-ThA7 Monitoring Ultra-Thin Organic Film Growth, In-Situ, with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry K.B. Rodenhausen, B.A. Duensing, A.K. Pannier, M. Schubert, University of Nebraska-Lincoln, M. Solinsky, The Procter & Gamble Company, T.E. Tiwald, J. A. Woollam Co., Inc. |
| 4:20pm | EL+AS+EM+MS+TF-ThA8 Ellipsometric Studies of Electronically Coupled PbSe and PbS Quantum Dot Thin Films S.G. Choi, National Renewable Energy Laboratory, O.E. Semonin, University of Colorado, J.M. Luther, M.C. Beard, A.G. Norman, National Renewable Energy Laboratory, Z. Lin, Colorado School of Mines, A. Franceschetti, National Renewable Energy Laboratory, M.T. Lusk, Colorado School of Mines, A.J. Nozik, National Renewable Energy Laboratory |
| 4:40pm | EL+AS+EM+MS+TF-ThA9 In-situ Temperature Measurements by Spectroscopic Ellipsometry: Application to a-Si based Thin Films D. Daineka, LPICM, CNRS, Ecole Polytechnique, France, V. Suendo, Institut Teknologi Bandung, Indonesia, P. Roca i Cabarrocas, LPICM, CNRS, Ecole Polytechnique, France |
| 5:00pm | EL+AS+EM+MS+TF-ThA10 Real Time Spectroscopic Ellipsometry Studies of Amorphous and Nanocrystalline Si1-xGex:H Thin Films for Microbolometer Applications D.B. Saint John, H.-B. Shin, M.-Y. Lee, E.C. Dickey, T.N. Jackson, N.J. Podraza, Penn State University |
| 5:20pm | EL+AS+EM+MS+TF-ThA11 Roll-to-Roll Fabrication of Thin Film Si:H Solar Cells: Real Time Monitoring and Post Deposition Mapping by Spectroscopic Ellipsometry L.R. Dahal, Z. Huang, D. Attygalle, M.N. Sestak, C. Salupo, S.X. Marsillac, R.W. Collins, University of Toledo |