| AVS 57th International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS1-ThM2 Chemical State Thin Film Characterisation by Angle Resolved XPS Using the Maximum Entropy Method A.J. Roberts, G. Mishra, K. Macak, Kratos Analytical Ltd., UK, C. Moffitt, Kratos Analytical Inc., UK |
| 8:40am | AS1-ThM3 Invited Paper Strategies for Multivariate Analysis of Very Large Spectral Images M.R. Keenan, Consultant |
| 9:20am | AS1-ThM5 Report on the 59th IUVSTA Workshop: Surface Chemical Analysis – Improving Data Interpretation by Multivariate & Informatics Techniques J. Tyler, University of the West Indies, Trinidad and Tobago |
| 9:40am | AS1-ThM6 Multivariate Analysis of NEXAFS Spectrum Images J.A. Ohlhausen, M.T. Brumbach, Sandia National Laboratories, C. Jaye, D.A. Fischer, NIST, E. Principe, P. Sobol, Synchrotron Research, Inc. |