| AVS 57th International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-WeA1 Exploring the Surface Sensitivity of ToF-SIMS: Measuring the Implantation Depths and Sampling Depths of Bin and C60 Ion Sources in Organic Films S. Muramoto, J. Brison, D.G. Castner, University of Washington |
| 2:20pm | AS-WeA2 A New Cluster Ion Beam for Advanced Molecular Depth Profiling of Polymers by TOF-SIMS T. Miyayama, S. Iida, N. Sanada, M. Suzuki, ULVAC-PHI, Japan, G.L. Fisher, J.S. Hammond, S.R. Bryan, Physical Electronics |
| 2:40pm | AS-WeA3 Nanoparticle Surface Analysis by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Low Energy Ion Scattering (LEIS) T. Grehl, P. Bruener, E. Niehuis, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., R. ter Veen, M. Fartmann, D. Breitenstein, Tascon GmbH, Germany |
| 3:00pm | AS-WeA4 Dual Beam Depth Profiling of Organic Materials by Time-of-Flight Secondary Ion Mass Spectrometry under Optimized Ion Beam Conditions D. Rading, R. Moellers, F. Kollmer, T. Grehl, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., E. Niehuis, ION-TOF GmbH, Germany |
| 4:00pm | AS-WeA7 Fundamental Sputtering Yields of Nanoparticles using SIMS J.L.S. Lee, I.S. Gilmore, D.C. Cox, M.P. Seah, S.J. Spencer, National Physical Laboratory, UK |
| 4:20pm | AS-WeA8 SIMS: Cluster Primary Ion Sputtering - Practical Reference Data and Outlook for High-Resolution Organic Imaging I.S. Gilmore, T.L. Salter, J.L.S. Lee, F.M. Green, M.P. Seah, National Physical Laboratory, UK |
| 4:40pm | AS-WeA9 Sample Preparation of Cellular Samples for ToF-SIMS Analysis M.A. Robinson, D.G. Castner, University of Washington |
| 5:00pm | AS-WeA10 "Wet SIMS": A Novel Molecular Imaging Technique for Biological Material Analysis J. Matsuo, Kyoto University, CREST, Japan, H. Yamada, Y. Wakamatsu, Kyoto University, Japan, T. Aoki, T. Seki, Kyoto University, CREST, Japan |
| 5:20pm | AS-WeA11 Improvement of Organic Ion Yields in Secondary Ion Mass Spectrometry via Water Vapor Injection T. Mouhib, A. Delcorte, C. Poleunis, P. Bertrand, Université Catholique de Louvain, Belgium |
| 5:40pm | AS-WeA12 IonCCDTM for Charged Particle Detection: From sub-keV Electrons and keV Atomic and Molecular Ions to Hyperthermal Biomolecular Ions O. Hadjar, OI Analytical, W.C. Schnute, Dionex Corporation, J. Laskin, Pacific Northwest National Laboratory |