AVS 57th International Symposium & Exhibition | |
Thin Film | Wednesday Sessions |
Session TF-WeA |
Session: | Thin Films: Growth and Characterization |
Presenter: | P. Cyganik, Jagiellonian University, Poland |
Authors: | P. Cyganik, Jagiellonian University, Poland S. Wyczawska, Catholic University Leuven, Belgium F. Vervaecke, Catholic University Leuven, Belgium E. Vandeweert, Catholic University Leuven, Belgium P. Lievens, Catholic University Leuven, Belgium |
Correspondent: | Click to Email |
Due to the ease of preparation and their relatively high stability, self-assembled monolayers (SAMs) are very promising candidates to be used in the development of micro- and nano-structured materials. With numerous detailed studies available nowadays for SAMs, the identification of SAMs adsorption geometry and stability of molecule-substrate interface still remains controversial and rather difficult to access experimentally. In this presentation we report experiments on ion-induced desorption and resonance enhanced ionization mass spectrometry of SAMs on Au(111) substrate.1 Althrough ion-induced desorption is commonly considered as a very invasive process when used for probing monomolecular films, our experiments demonstrate that this method can be successfully applied to monitor fine changes in the molecule-substrate interface stability of model SAMs systems based on thiols ( CH3‑C6H4‑C6H4-(CH2)n-S-Au(111), n = 2-6) and selenols (BPnSe, CH3‑C6H4‑C6H4-(CH2)n-Se-Au(111), n = 2-6) . Current desorption experiments will be discussed together with recent microscopic2 and spectroscopic3 analysis of the molecular structure and stability of these SAMs. We demonstrate that lower or higher ion-induced bond scission efficiency can be correlated with, respectively, higher or lower chemical stability of particular chemical bonds. Thus, a new method for probing the stability of the substrate-SAM interface can be proposed.
References
(1) S. Wyczawska, F. Vervaecke, et al. in preparation.
(2) P. Cyganik, K. Szelagowska-Kunstman, et al. J. Phys. Chem. C 2008, 112, 15466.
(3) K. Szelagowska-Kunstman, P. Cyganik, et al. Phys. Chem. Chem. Phys. 2010, 12, 4400.