AVS 57th International Symposium & Exhibition
    Thin Film Wednesday Sessions
       Session TF-WeA

Invited Paper TF-WeA1
Growth and Characterization of Thin Films for Organic Electronics Applications

Wednesday, October 20, 2010, 2:00 pm, Room Pecos

Session: Thin Films: Growth and Characterization
Presenter: D.J. Gaspar, Pacific Northwest National Laboratory
Authors: D.J. Gaspar, Pacific Northwest National Laboratory
L. Wang, Pacific Northwest National Laboratory
Z.H. Zhu, Pacific Northwest National Laboratory
M.H. Engelhard, Pacific Northwest National Laboratory
B.J. Tarasevich, Pacific Northwest National Laboratory
J.S. Swensen, Pacific Northwest National Laboratory
R.E. Williford, Pacific Northwest National Laboratory
M.E. Gross, Pacific Northwest National Laboratory
W.D. Bennett, Pacific Northwest National Laboratory
D.W. Matson, Pacific Northwest National Laboratory
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There are two basic ways of generating organic thin films for electronics applications – vacuum-based processes and solution processes (each with many variations). Each has advantages and disadvantages in film purity, morphology, deposition rate, process control, molecular design and materials choices. This presentation will describe the deposition, characterization and performance of organic thin films deposited using variants of both methods for organic light emitting diodes (OLEDs), organic thin film transistors (OTFTs), and other applications utilizing electroactive organic thin films. Specific advantages in film purity and access to different classes of materials are discussed. Surface characterization using time of flight secondary ion mass spectrometry (TOF-SIMS), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM and conductive AFM), ellipsometry and Fourier transform infrared spectroscopy (FTIR) are used to characterize thin films, highlighting the challenges in characterizing these often sensitive and usually amorphous films, as well as need to develop a solid experimental understanding of the composition and structure of thin films deposited for organic electronics applications to understand performance.