AVS 57th International Symposium & Exhibition | |
Thin Film | Tuesday Sessions |
Session TF-TuP |
Session: | Thin Film Poster Session I |
Presenter: | M. Groner, ALD NanoSolutions, Inc. |
Authors: | M. Groner, ALD NanoSolutions, Inc. A.I. Abdulagatov, University of Colorado R. Fitzpatrick, University of Colorado S.M. George, University of Colorado B. Wu, Montana State University T. Minton, Montana State University |
Correspondent: | Click to Email |
Polymers used on spacecraft are subjected to various threats including hyperthermal oxygen atoms, UV and VUV photons, and ions. These threats can degrade the polymer and lead to static charge accumulation. Nanometer thick inorganic films grown by atomic layer deposition (ALD) can protect polymers including Kapton, Teflon, and PMMA. We are developing multifunctional multilayer ALD films incorporating Al2O3 layers for preventing oxygen atom erosion, TiO2 to minimize UV/VUV radiation damage, and ZnO to dissipate static charge. Such ALD-coated polymeric films are currently being tested in low Earth orbit on the International Space Station on MISSE-7b. In the laboratory, we are further exploring the mechanisms of polymer degradation by atomic oxygen and VUV radiation, as well as the cracking of inorganic films on polymers resulting from different thermal expansion coefficients. Field emission scanning electron microscopy images and profilometry measurements revealed that Kapton H samples coated with 25 ALD cycles (~3 nm) of Al2O3 completely resisted atomic oxygen erosion. Quartz crystal microbalance measurements of TiO2 films deposited on PMMA substrates with an Al2O3 interfacial adhesion layer showed that 100 cycles (~6.2 nm) of TiO2 resisted PMMA degradation upon VUV exposure. Mass losses of VUV-exposed PMMA samples coated with similar overall bilayer thicknesses but different Al2O3 thicknesses were compared to decouple the role of the overall Al2O3/TiO2 bilayer coating acting as a physical barrier from the role of TiO2 acting as a VUV filter.