AVS 57th International Symposium & Exhibition
    Magnetic Interfaces and Nanostructures Thursday Sessions
       Session MI-ThP

Paper MI-ThP4
Magnetic Properties of Zn1-xMnxO Thin Film Grown by Pulsed Laser Deposition

Thursday, October 21, 2010, 6:00 pm, Room Southwest Exhibit Hall

Session: Magnetic Interfaces Poster Session
Presenter: T.C. Wu, National Applied Research Laboratories, Taiwan
Authors: T.C. Wu, National Applied Research Laboratories, Taiwan
Y.C. Yeh, National Applied Research Laboratories, Taiwan
D.R. Liu, National Applied Research Laboratories, Taiwan
H.J. Lin, National Synchrotron Radiation Research Center, Taiwan
M.J. Huang, National Synchrotron Radiation Research Center, Taiwan
Correspondent: Click to Email
In this paper, Zn1-xMnxO (x=0~0.1) thin films were grown on corning glass、sapphire (0001) and silicon (100) substrates by pulsed laser deposition (PLD). Atomic force microscopy (AFM) and magnetic force microscopy (MFM) were used to characterize the surface properties of Zn1-xMnxO thin film, and the high-resolution x-ray diffraction (XRD) was used to measure the crystallographic structure of this film. Moreover, superconducting quantum interference device (SQUID) magnetometer was employed to investigate the magnetic moments. X-ray magnetic circular dichroism (XMCD) spectra of Zn1-xMnxO films were also measured to clarify their spin and orbital magnetic moment properties. Integrating above measurements, these results reveal that substrate plays an important role and oxygen is the key factor for magnetic properties of Zn1-xMnxO thin films.