| AVS 57th International Symposium & Exhibition | |
| Magnetic Interfaces and Nanostructures | Thursday Sessions |
| Session MI+TF-ThM |
| Session: | Magnetic Nanostructures, Thin Films and Heterostructures |
| Presenter: | F.A. Perez, West Virginia University |
| Authors: | F.A. Perez, West Virginia University D. Lederman, West Virginia University |
| Correspondent: | Click to Email |
FexNi1-xFe/Co bilayers were deposited on single-crystal MgF2 (110) substrates via molecular-beam epitaxy. The RHEED patterns were used to characterize the surface crystallinity during growth. The high angle x-ray diffraction (XRD) allowed establishing epitaxial growth directions and in- and out-of-plane crystallinity coherences. The x-ray reflectivity (XRR) patterns were used to establish the layer thicknesses and the interface roughness parameters. The Fe-concentration was estimated from XRD lattice parameters and the XRR fittings and it was according with that from XPS analysis. The magnetic anisotropies of the Co layer were measured via standard magnetometry measurements.