AVS 57th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy Topical Conference Tuesday Sessions
       Session IS+SS-TuM

Invited Paper IS+SS-TuM9
Hard X-ray Photoelectron Spectroscopy: an Effective Probe for Electronic Structure in Materials Science

Tuesday, October 19, 2010, 10:40 am, Room Acoma

Session: In Situ Spectroscopy – Interfacial Chemistry/Catalysis
Presenter: W. Drube, Deutsches Elektronen-Synchrotron DESY, Germany
Correspondent: Click to Email

The use of hard X-ray excitation in the range from about 2 to 15 keV for photoelectron spectroscopy (HAXPES) is a rapidly emerging technique at synchrotron sources worldwide since it significantly widens the range of applications, in particular in the study of complex materials and buried nano-structures or interfaces. Due to the increased electron inelastic mean free paths, it becomes possible to probe chemical composition and electronic structure in the bulk of materials with considerable sensitivity, down to typically 10-20 nm at 10 keV kinetic energy. This not only is essential in the study of complex correlated materials which often exhibit a modified surface electronic structure but also is very relevant for technologically interesting multi-layered materials with buried interfaces. As an additional benefit, "as-grown" materials can be measured without need for prior surface treatment.

A drawback is the rapidly decreasing photoelectric cross section in the hard X-ray range, especially for shallow core levels and valence states, and - until recently - the limited availability of suitable high-voltage electron spectrometers. The latter are available meanwhile and the high X-ray flux at undulator beamlines has been shown to effectively compensate the cross section decrease. In addition, the X-ray tunability over a large energy range not only allows to significantly vary the electron probing depths and the photoelectric cross sections, but also enables the study of resonance phenomena at deep inner-shell thresholds. Further, the excitation of X-ray standing wave fields within single crystals or multi-layered structures can be effectively used to correlate geometric and electronic structure information.

In the past five years, HAXPES activities at synchrotron laboratories worldwide have increased dramatically and the trend continues as new instruments are currently being built and planned. A brief overview is given on the current activities worldwide, both on instrumental developments and results obtained. At DESY, HAXPES experiments routinely use a dedicated spectrometer at an X-ray wiggler with moderate energy resolution (~0.5 eV), well suited for many core level studies. Very recently, high-resolution studies also became possible at DESY with the availability of PETRA III, a new storage ring source providing the highest X-ray brilliance.