AVS 57th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy Topical Conference Tuesday Sessions
       Session IS+SS-TuM

Paper IS+SS-TuM11
Novel Applications in Surface Science – In situ Sample Analysis in Extreme Environments

Tuesday, October 19, 2010, 11:20 am, Room Acoma

Session: In Situ Spectroscopy – Interfacial Chemistry/Catalysis
Presenter: A. Thissen, SPECS Surface Nano Analysis GmbH, Germany
Correspondent: Click to Email
Modern devices are often only functional in environments far away from ultrahigh vacuum, still being the standard operation conditions for all Surface Science techniques. In parallel the importance of surfaces for the correct device operation is continuously increasing due to miniaturiziation down to the nanoscale. To contribute to advanced materials analysis in future means using Photoelectron spectroscopy, Scanning Probe Microscopies and related techniques in the generic or near generic device environments. This means high, elevated or near ambient pressures of defined working gas mixtures, liquid media, potentials or magnetic fields applied. Also extremely low or high temperatures might be necessary. In past all standard Surface Science Techniques did not work under these extreme environments. This work summarizes and presents existing solutions nowadays and future development routes to new instruments and materials analysis methods being functional under these working conditions. Opportunities and limits will be discussed. from the perspective of a supplier of scientific instruments. Finally applications, examples and results from existing In situ methods like high pressure treatments cells, complete High Pressure or Near Ambient Pressure Photoelectron Spectroscopy Systems (NAP-PES or HP-SPM), liquid and electrochemical cells, Liquid sample “manipulators“, and concepts and status of equipment working in highest or lowest temperatures, high magnetic fields and static or dynamic potentials will be demonstrated.