| AVS 57th International Symposium & Exhibition | |
| Graphene Focus Topic | Tuesday Sessions |
| Session GR+TF-TuM |
| Session: | Characterization, Properties, and Applications |
| Presenter: | N.G. Kalugin, New Mexico Tech |
| Correspondent: | Click to Email |
Near-field microwave microscopy can be used as an alternative to atomic-force microscopy or Raman microscopy in determination of graphene thickness. We evaluated the values of AC impedance for few layer graphene. The impedance of mono and few-layer graphene at 4GHz was found predominantly active. Near-field microwave microscopy allows simultaneous imaging of location, geometry, thickness, and distribution of electrical properties of graphene without device fabrication. Our results may be useful for design of future graphene-based microwave devices.
Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the
United States Department of Energy's National Nuclear Security Administration under contract DE-AC04 94AL85000.