ToF-SIMS has become the tool of choice in a wide variety of today's surface and interface analysis tasks. The level of performance required of these tasks varies enormously, resulting a wide range in the capability of available instruments. SAI's expertise in ToF-MS technology has enabled it to offer instruments both at the top end of the scale and at the entry level making sure customers are uniquely well served in their quest to match investment levels to their task set. Illustrative data will be presented in the talk to demonstrate the concept across the gamut of SIMS applications.