AVS 57th International Symposium & Exhibition
    Energy Frontiers Topical Conference Thursday Sessions
       Session EN-ThP

Paper EN-ThP4
Characteristics of Undoped ZnO as Window Layer for CIGS Thin Film Solar Cell using Nano-Inks

Thursday, October 21, 2010, 6:00 pm, Room Southwest Exhibit Hall

Session: Energy Frontiers Topical Conference Poster Session
Presenter: E.C. Choi, Sungkyunkwan University, Republic of Korea
Authors: E.C. Choi, Sungkyunkwan University, Republic of Korea
J. Chang, Sungkyunkwan University, Republic of Korea
D.Y. Jung, Sungkyunkwan University, Republic of Korea
B. Hong, Sungkyunkwan University, Republic of Korea
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ZnO is a very useful material as II-VI compound semiconductor with a wide band gap of 3.3 eV and a property of native n-type semiconductors. It has been studied actively due to its excellent optical, electrical and structural properties suitable for many applications such as transparent conductive oxide (TCO), solar cell window layer and surface acoustic wave (SAW) devices. In particular, n-type and undoped ZnO films are used as the window layer of GIGS solar cell (n-ZnO/i-ZnO/CdS/CIGS/Mo/glass).

The surface morphology of CIGS film deposited on Mo/glass substrate by liquefied deposition method using nano-inks is severely uneven and the film has many crevices. Also, the CBD-CdS layer with the thicknesses of about 50 nm does not perfectly cover the surface of the CIGS layer. Consequently, these crevices, which remain before the TCO deposition, lead to the formation of shunt path between TCO and CIGS layers.

Therefore, in this study, we investigate the role of undoped ZnO film with high resistivity to prevent the shunt path between TCO and CIGS layers, and ZnO films are deposited varying the thickness and the plasma power to investigate characteristics of undoped ZnO film for CIGS solar cell. It is confirmed that the efficiency of CIGS solar cell depends on the properties of the undoped ZnO films. The films are deposited using magnetron sputtering system in argon ambient and are analyzed using Hall measurement, UV-visible spectrometer and XRD.