| AVS 57th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuP |
| Session: | Applied Surface Science Poster Session |
| Presenter: | J.F. Portoles, Newcastle University, UK |
| Authors: | J.F. Portoles, Newcastle University, UK P.J. Cumpson, Newcastle University, UK |
| Correspondent: | Click to Email |
AFM has become in the last two decades an instrument for the measurement of forces in the piconewton range, including forces at the single molecule level. Although many methods have been developed for the force calibration of AFM cantilevers [1], these use to be affected by high uncertainties and sometimes difficulty of use. Furthermore there is a growing need for a traceable force calibration standard that provides traceability to the units of the SI [2] and therefore allows comparison between instruments and with related force measurement techniques such as the Optical Tweezers and the Biomembrane Force Probe. We present the development of a device that provides fast and easy force calibration of AFM cantilevers and other force probes, simultaneously facilitating the dissemination of force and providing traceability to the units of the SI.
[1] J.L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64 (7) 1993, pp. 1868-1873
[2] P.J. Cumpson and J. Hedley, Nanotechnology 14 (12) 2003, pp. 1279-1288