| AVS 57th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuP |
| Session: | Applied Surface Science Poster Session |
| Presenter: | R. Hesse, Universität Leipzig, Germany |
| Authors: | R. Hesse, Universität Leipzig, Germany R. Denecke, Universität Leipzig, Germany |
| Correspondent: | Click to Email |
The shape of the background in x-ray photoemission spectra may be affected by secondary electrons and inelastic energy loss processes. A polynomial of low order has very often turned out to model the secondary electron background. The Tougaard background model [1] has been successfully used to characterise the inelastic loss processes. However, the correct usage of the Tougaard background needs a well defined K(T) function (T = energy loss). The introduction of a four parameter loss function K(T) = BT/(C-C’T²)²+DT² with the fitting parameters B, C, C’ and D implemented in the fittable background function [2] allows the improved estimation of the K(T) function. The results will be compared with the recommended parameters by Tougaard. The calculation of inelastic electron scattering cross sections of clean surfaces from different materials using UNIFIT will be demonstrated.
[1] S. Tougaard, Surf. Interface Anal. 25 (1997) 137
[2] R. Hesse, T. Chassé, R. Szargan, Fresenius J. Anal. Chem., 365 (1999) 48