| AVS 57th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuA |
| Session: | Advances in Surface and Interface Imaging |
| Presenter: | K. Artyushkova, University of New Mexico |
| Correspondent: | Click to Email |
Applications of multivariate analysis (MVA) methods to surface analysis imaging datasets have increased quite significantly in recent years. Multivariate analysis of 3D imaging TOF-SIMS and XPS data is now quite widely applied (even routinely used by some research groups). Data preprocessing, scaling and selection of appropriate multivariate analysis method have been discussed in the literature quite extensively in a couple of recent years.
What has been addressed in a lesser extent is an important problem of combining quantitative analysis of imaging datasets from the same analytical method from various samples (multi-sample 3D imaging) or combining various analytical data (spectroscopic, imaging, or scalar) obtained for the same sample (multi-modal analysis).
Approaches to quantitatively combine imaging datasets from multiple samples will be discussed on example of multispectral XPS imaging data sets acquired from various paper samples.
Multi-modal analysis will be discussed on example of combining spectroscopic (XPS, XANES), microscopic (SEM) and macroscopic (BET surface area and pore size distribution) data from set of non-Pt group metal electrocatalysts for oxygen reduction reaction treated at different temperatures.