AVS 56th International Symposium & Exhibition | |
Vacuum Technology | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | VT-MoA1 Investigations on the Dynamic Response of Pirani Gauges M. Wüest, B. Andreaus, R. Stocker, INFICON, Liechtenstein |
2:20pm | VT-MoA2 Portable Gas Sampling Instrument Capable of Measuring Leak Rates, Volumes, and Pressures without A/C Power S. Thornberg, J. Brown, Sandia National Laboratories, L. Miller, J. Ithaca, B&W Pantex |
2:40pm | VT-MoA3 Mass Spectrometer Sampling of Transient Gas Compositions in Processes R.E. Ellefson, Consultant |
3:00pm | VT-MoA4 A Novel Electrostatic Ion Trap Mass Spectrometer A.V. Ermakov, B.J. Hinch, Rutgers University |
3:40pm | VT-MoA6 A Practical Electrostatic Ion-Trap Sensor G.A. Brucker, J. Rathbone, S. Blouch, M. Schott, K. Van Antwerp, Brooks Automation, Inc. |
4:00pm | VT-MoA7 Total Pressure Measurement Integrated into a Ratiometric Partial Pressure Electrostatic Ion Trap Sensor P.C. Arnold, G.A. Brucker, Brooks Automation, Inc. |
4:20pm | VT-MoA8 Instrument Design for an Integrated Total and Partial Pressure High Speed Vacuum Quality Monitor Sensor M. Schott, J. Rathbone, P. Sandt, K. Van Antwerp, Brooks Automation Inc. |
4:40pm | VT-MoA9 NIST Traceable Vacuum Standard Based upon MEMS Resonant Silicon Gauge Technology J. Hendricks, T. Gooding, D.A. Olson, National Institute of Standards and Technology |
5:00pm | VT-MoA10 A New Approach to Gas Flow Calibration P.D. Levine, Zero K Designs |