| AVS 56th International Symposium & Exhibition | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS+EM+MS+TF-MoM1 Optical Properties of Bulk GaSe and InSe Single Crystals S.G. Choi, National Renewable Energy Laboratory, C. Martinez-Tomas, V. Munoz Sanjose, Universitat de Valencia, Spain, D.H. Levi, National Renewable Energy Laboratory |
| 8:40am | AS+EM+MS+TF-MoM2 Ellipsometric Porosimetry for the Microstructure Characterization of Plasma-Deposited SiO2-Like Films M. Creatore, N.M. Terlinden, G. Aresta, M.C.M. van de Sanden, Eindhoven University of Technology, The Netherlands |
| 9:00am | AS+EM+MS+TF-MoM3 Invited Paper Industrial Applications of Spectroscopic Ellipsometry J.A. Woollam, J.A. Woollam Company, Inc., J.N. Hilfiker, P. He, J.A. Woollam Company Inc. |
| 9:40am | AS+EM+MS+TF-MoM5 Spectroscopic Ellipsometry Studies of Sputtered Vanadium Oxide Thin Films N.J. Podraza, B.D. Gauntt, M.A. Motyka, E.C. Dickey, M.W. Horn, The Pennsylvania State University |
| 10:00am | AS+EM+MS+TF-MoM6 Real Time Spectroscopic Ellipsometry Studies of Si:H and Ge:H Thin Films for Microbolometer Applications D. Saint John, E.C. Dickey, N.J. Podraza, The Pennsylvania State University |
| 10:40am | AS+EM+MS+TF-MoM8 Non-destructive Determination of Spatial Distributions of Free-Charge-Carriers in Low Doped Semiconductors using THz Ellipsometry T. Hofmann, University of Nebraska-Lincoln, C.M. Herzinger, J. A. Woollam Co. Inc., M. Schubert, University of Nebraska - Lincoln |
| 11:00am | AS+EM+MS+TF-MoM9 Ellipsometric Depth Profiling of Polymer-Blend Films for Organic Electronics and Photovoltaics L.J. Richter, D.S. Germack, D.M. DeLongchamp, D.A. Fischer, V.M. Prabhu, D.J. Gundlach, National Institute of Standards and Technology, J.E. Anthony, University of Kentucky, N. Shin, D. Yoon, Seoul National University, Korea |
| 11:20am | AS+EM+MS+TF-MoM10 Thickness Variations Determined by Spectroscopic Ellipsometry in Organometallic Chemical Vapor Deposition: Connection to Growth Processes X. Liu, D.E. Aspnes, North Carolina State University |
| 11:40am | AS+EM+MS+TF-MoM11 Optical Anisotropy Induced by Oblique Incidence Ion Bombardment of Ag(001) H. Wormeester, F. Everts, B. Poelsema, University of Twente, The Netherlands |