AVS 56th International Symposium & Exhibition
    Thin Film Thursday Sessions
       Session TF-ThP

Paper TF-ThP22
Design and Fabrication of Optical Thin Films for Remote Sensing Instrument

Thursday, November 12, 2009, 6:00 pm, Room Hall 3

Session: Aspects of Thin Films Poster Session
Presenter: C.N. Hsiao, National Applied Research Laboratories, Taiwan
Authors: C.N. Hsiao, National Applied Research Laboratories, Taiwan
H.P. Chen, National Applied Research Laboratories, Taiwan
P.K. Chiu, National Applied Research Laboratories, Taiwan
W.H. Cho, National Applied Research Laboratories, Taiwan
Y.W. Lin, National Applied Research Laboratories, Taiwan
D.P. Tsai, National Applied Research Laboratories and National Taiwan University
Correspondent: Click to Email
Optical thin films of Ag mirror and band pass filters were design and deposited on radiation-resistance glass by ion beam assisted deposition for the use of optical payload in remote sensing instrument. Optical parameters were optimized by the admittance loci analysis to show that the mirror and filters can achieve average reflectance of 99 % in visible spectrum and average transmittances of 95 % in the spectral range of blue, green, red, NIR and pan chromatic, respectively. The corresponding properties of films were investigated by in-situ optical monitoring, spectrometer, ellipsometry and high resolution transmission electron microscopy (HRTEM). It was found that the average reflectance of Ag mirror(with protect coating) is above 98 %. The average transmittances are above 85 % for all the five band pass filters, with the rejection transmittance lower than 1% in the spectral range of 350~1100 nm. Furthermore, in order to determinate the optical stability of optical thin films for aerospace applications, space environmental test was simulated by using a Co60 gamma (g) radiation source (total dose of 35 krad and 1 Mrad). The optical stability of the films with the radiation test will be discussed.