| AVS 56th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology | Thursday Sessions |
| Session NS-ThM |
| Session: | Characterization and Imaging at the Nanoscale |
| Presenter: | M. Gordon, University of California Santa Barbara |
| Authors: | I. Riisness, University of California Santa Barbara R. Ramos, University of California Santa Barbara C. Carach, University of California Santa Barbara M. Gordon, University of California Santa Barbara |
| Correspondent: | Click to Email |
Scanning probe microscopy (SPM) has truly revolutionized the morphological and electrical characterization of surfaces at the nanoscale; however, it is still impossible to identify and image the chemical functionality of a surface at similar resolutions. For the latter, one desires a hybrid probe system which combines traditional SPM functionality with spatially-correlated spectroscopic (chemical) data at length scales <10 nm.
To this end, we will highlight multifunctional surface imaging of chemistry, morphology, and elastic/electrical properties for several material systems using our hybrid SPM instrument. In this system, a plasmonically-active metallic tip is used to locally enhance EM fields in the tip-surface gap, enabling near-field chemical imaging via Raman spectroscopy. In this talk, we will discuss instrument design, tip preparation/characterization, and initial imaging results on polythiophene-based photovoltaic films, phase-segregated diblock co-polymers, and adsorbates on metallic nanoparticles.