AVS 56th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy: Interfacial and Nanoscale Science Topical Conference Friday Sessions
       Session IS+AS-FrM

Invited Paper IS+AS-FrM5
Probing Interfacial Atomic and Electronic Structures at Atomic Resolution

Friday, November 13, 2009, 9:40 am, Room C4

Session: In-Situ Microscopy and Spectroscopy: Dynamic Nanoscale Processes
Presenter: J.-M. Zuo, University of Illinois - Urbana-Champaign
Correspondent: Click to Email
Interfaces are important because they are essential for the function of materials, especially for nanomaterials. New research in oxide thin-films also shows that interfaces can be used to generate new electronic structures. However, interface characterization is always a challenge. Here, I will present our progress in probing atomic structure and electronic structure of interfaces based on aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy (EELS). Specifically I will cover two topics, one is the epitaxial interface between metal nanocrystals and oxides and the other is atomic scale oxide superllatices. I will illustrate the resolution of the aberration corrected electron microscopy and EELS, and what we have leant from these characterizations.