AVS 56th International Symposium & Exhibition | |
Graphene Topical Conference | Wednesday Sessions |
Session GR+AS-WeA |
Session: | Graphene: Surface Characterization |
Presenter: | S. Nie, Sandia National Laboratories |
Authors: | S. Nie, Sandia National Laboratories E. Loginova, Sandia National Laboratories K. Thürmer, Sandia National Laboratories N.C. Bartelt, Sandia National Laboratories K.F. McCarty, Sandia National Laboratories |
Correspondent: | Click to Email |
We use scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM) to study four different orientations of single-layer graphene sheets on Ir(111). The most-abundant orientation (R0) has been previously characterized in the literature [1]. While less prevalent than R0, the three additional structures can still occur as relatively large domains, tens of microns in spatial extent. We find that the four types of graphene differ simply in how the graphene sheets are oriented relative to the in-plane directions of the Ir lattice. That is, the four types of graphene are rotational variants, similar to the rotational variants of graphene on Pt(111) [2,3]. Using selective-area LEED, we find the graphene sheets in the other three variants to be rotated by approximately 14°, 18.5° and 30° (R30), respectively. The R30 structure is studied in detail with STM. Compared with the R0 structure, R30 has much less height corrugation. We propose atomic models for the new variants. The moiré structures can be classified using simple geometric rules involving the different periodic and quasiperiodic structural motifs. In addition, LEEM reveals that linear defects form in the graphene sheets during cooling from the synthesis temperature. STM shows that the defects are ridges where the graphene sheets locally delaminate as the Ir substrate contracts. We will describe the factors that control the relative abundance of the different variants.
[1] A. T. N'Diaye, J. Coraux, T. N. Plasa, C. Busse, and T. Michely, New J. Phys. 10, 16 (2008).
[2] T. A. Land, T. Michely, R. J. Behm, J. C. Hemminger, and G. Comsa, Surf. Sci. 264, 261 (1992).
[3] M. Sasaki, Y. Yamada, Y. Ogiwara, S. Yagyu, and S. Yamamoto, Phys. Rev. B 61, 15653 (2000).