| AVS 56th International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
| Session AS1-ThM |
| Session: | Advances in Surface Analysis |
| Presenter: | A.M. Spool, Hitachi Global Storage Technologies, Inc. |
| Authors: | A.M. Spool, Hitachi Global Storage Technologies, Inc. R. Waltman, Hitachi Global Storage Technologies, Inc. R. White, Hitachi Global Storage Technologies, Inc. |
| Correspondent: | Click to Email |
This work continues a previous study1 on thin overcoat effects on ion attenuation, and the change the proximity of the underlying metal layer has on the spectra of organic materials on top of the carbon. In this study, the overcoat thickness was varied over a larger range than in the previous study, down to bare metal. The samples were measured before and after application of a thin polymer film, a perfluoropolyether commonly used as a lubricant in the hard disk drive industry (Z-Tetraol). The spectra of the lubricant coated samples were explored both for the effect of the lubricant coating on the metal attenuation and for the effect of the varying carbon layer thickness on the lubricant spectra. For this series of samples, the total ion count is expected to vary from sample to sample as it reflects the differences between samples as much as relative individual ion intensities does. Also, the carbon itself produces little signal in TOF-SIMS spectra. The use of a system involving external standards will be described that allows the comparison of spectra from day to day without normalization.
1. Spool, A.; White, R., “Probing Thin Over Layers with Variable Energy / Cluster Ion Beams”, Appl. Surf. Sci. Volume: 252 Issue: 19 (2006) 6517-6520