| AVS 53rd International Symposium | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | NS1-TuM1 Electronic Transport in Nanometer-Scale Silicon Membranes P. Zhang, E. Tevaarwerk, B. Park, D.E. Savage, University of Wisconsin-Madison, G. Celler, Soitec USA, I. Knezevic, P. Evans, M.A. Eriksson, M.G. Lagally, University of Wisconsin-Madison |
| 8:20am | NS1-TuM2 Nanoelectronic Device Characterization: Correlating Internal Nanoscale Chemical and Physical Structure with Electrical Behaviour W.F. Stickle, Hewlett Packard Company, D.R. Stewart, J.J. Blackstock, C.L. Donley, R.S. Williams, Hewlett Packard Labs |
| 8:40am | NS1-TuM3 Invited Paper Manipulating Liquids on the Tunable Nanostructured Surfaces T.N. Krupenkin, A. Taylor, P.R. Kolodner, M.S. Hodes, J. Aizenberg, Bell Labs, Lucent Technologies |
| 9:20am | NS1-TuM5 Ideal Control of Carbon Nanotube Field Effect Transistor Characteristics depending on Precise Work Function Difference K. Matsumoto, Osaka University, Japan |
| 9:40am | NS1-TuM6 Vertically Aligned Carbon Nanofibers for Energy Storage Applications K.-Y. Tse, V. Dementiev, L.Z. Zhang, S.E. Baker, P. Warf, R. West, R.J. Hamers, University of Wisconsin-Madison |
| 10:40am | NS1-TuM9 Local Probing of Polarization Switching in Low-Dimensional Ferroelectrics S. Jesse, B.J. Rodriguez, S.V. Kalinin, Oak Ridge National Laboratory, E.A. Eliseev, A.N. Morozovska, National Academy of Science of Ukraine |
| 11:00am | NS1-TuM10 Quantitative Measurement of Tip-Sample Forces in Amplitude Modulation Atomic Force Microscopy H. Holscher, University of Munster, Germany |
| 11:20am | NS1-TuM11 Novel Standards for Dimensional and Analytical Nanometrology T. Dziomba, L. Koenders, P. Hinze, T. Weimann, Physikalisch-Technische Bundesanstalt, Germany, M. Ritter, A. Kranzmann, M. Senoner, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Germany |
| 11:40am | NS1-TuM12 Electronic Structure Studies of CdSe Nanocrystals Using Synchrotron Radiation R.W. Meulenberg, J.R.I. Lee, L.J. Terminello, T. van Buuren, Lawrence Livermore National Laboratory |
| 12:00pm | NS1-TuM13 Reliable XPS Measurement of Sub nm SiO@sub 2@ Thickness by Determination of the Surface Normal K.J. Kim, D.W. Moon, Korea Research Institute of Standards and Science, J.S. Jang, H.J. Kang, Chungbuk National University, Korea |