AVS 53rd International Symposium
    Vacuum Technology Wednesday Sessions
       Session VT-WeM

Paper VT-WeM4
Electron and Ion Desorption Studies at RHIC 

Wednesday, November 15, 2006, 9:00 am, Room 2000

Session: Electron, Photon and Ion-beam Induced Desorption and Their Effects on the Dynamics of Accelerators
Presenter: S.Y. Zhang, Brookhaven National Laboratory
Authors: S.Y. Zhang, Brookhaven National Laboratory
H.C. Hseuh, Brookhaven National Laboratory
P. Thieberger, Brookhaven National Laboratory
Correspondent: Click to Email
The electron cloud, beam induced pressure rise and experimental background are limiting factors of RHIC heavy ion and polarized proton luminosities. Electron and ion desorptions with the normal and shallow angle incidents are relevant in machine improvement. In this talk, the effects of electron and ion desorptions on steel, NEG and saturated NEG surface in machine operation, beam study, and test stand will be reported.