AVS 53rd International Symposium
    Ultra-Bright Light Sources Topical Conference Wednesday Sessions
       Session UB-WeM

Invited Paper UB-WeM9
Diffraction Microscopy

Wednesday, November 15, 2006, 10:40 am, Room 2001

Session: Ultra-Bright Light Sources Topical Conference
Presenter: J. Kirz, Stony Brook University and Lawrence Berkeley Lab
Correspondent: Click to Email
A coherently illuminated isolated specimen creates a speckle pattern in the far field. If the intensity of this diffraction pattern is recorded with sufficient detail, the image of the specimen can be reconstructed using an iterative algorithm. The principles of this "lensless" imaging technique will be presented, along with a description of the instrumentation used, and the technical challenges involved. The ultimate limitating factor in resolution is radiation damage to the specimen. While this technique is now being used by several groups, we will emphasize the work done by the Stony Brook/Cornell group working at the Advanced Light Source.