AVS 53rd International Symposium
    Ultra-Bright Light Sources Topical Conference Wednesday Sessions
       Session UB-WeM

Invited Paper UB-WeM1
Spectro-Microscopy with Undulator Radiation: Towards the Resolution Limits

Wednesday, November 15, 2006, 8:00 am, Room 2001

Session: Ultra-Bright Light Sources Topical Conference
Presenter: E. Umbach, University of Wuerzburg, Germany
Authors: E. Umbach, University of Wuerzburg, Germany
T. Schmidt, University of Wuerzburg, Germany
H. Marchetto, Fritz-Haber-Institute MPG, Germany
U. Groh, University of Wuerzburg, Germany
R. Fink, University of Erlangen, Germany
Correspondent: Click to Email
It is a dream of surface science to combine methods such as LEED, XPS, ARUPS, PhD, NEXAFS, and XAES with high spatial resolution and with microscopic techniques. Numerous successful microscopes called LEEM or X-PEEM are commercially available today. The heart of these instruments is a simple low-energy electron microscope consisting of objective and projective lenses and a 2-dim detector. However, due to aberrations these instruments are limited in their spatial and energy resolution. A collaboration of several groups has designed and built a new type of spectro-microscope that combines a "normal" LEEM/PEEM instrument with aberration corrections (chromatic AND spherical) and energy resolution using an imaging energy filter. The instrument is installed at BESSY II and uses photons and elec-trons as sources. A spatial resolution of 0.5 nm at an energy resolution of <100 meV is theoretically achievable at a hundred times higher transmission compared to conventional instruments. This instrument called SMART is now in the final phase of testing and commissioning. Concept, technical realization, and present achievements will be reported. The SMART allows to combine nearly simultaneously various electron micros-copy techniques (LEEM, PEEM, X-PEEM, MEM) with various high-resolution electron spectroscopy and electron diffraction techniques from small sample spots (nano-XPS, -ARUPS, -XAS, -LEED). First experiments on the growth mecha-nisms and dynamics of organic thin films, their dependence on substrate and sub-strate morphology, their molecular orientation, and on the internal structure of mi-crocrystallites show the potential of the instrument and will be presented in the talk.