AVS 53rd International Symposium
    Thin Film Thursday Sessions
       Session TF-ThP

Paper TF-ThP4
The Effect of Additive Oxide Material to the MgO Protecting Layer on the XPS Spectra and the Electrical Properties in AC-PDP

Thursday, November 16, 2006, 5:30 pm, Room 3rd Floor Lobby

Session: Thin Film Poster Session
Presenter: S.H. Moon, Seoul National University, South Korea
Authors: S.H. Moon, Seoul National University, South Korea
T.W. Heo, Seoul National University, South Korea
S.Y. Park, Seoul National University, South Korea
J.H. Kim, Seoul National University, South Korea
H.J. Kim, Seoul National University, South Korea
Correspondent: Click to Email

A MgO layer reduces the discharging voltage of AC-PDP (Alternating current â?" Plasma Display Panel) due to its high secondary electron emission coefficient and protects the dielectric layer from the ion bombardments during the discharge.@footnote 1-2@ The mechanism of secondary electron emission from MgO is basically understood by Auger neutralization and resonance neutralization.@footnote 3-4@ Considering to the mechanism, it is a key factor to control the work function or the summation of band gap and electron affinity.@footnote 5@ This report focused on the effect of additive oxide material to the MgO protecting layer on the XPS spectra and the electrical properties. Some kinds of materials, which have a lower work function than MgO, were chosen for adding. The pellets for the source of e-beam evaporation were fabricated by mixing the additive oxide powder with the MgO powder. Then, the mixed powder was pressed and sintered. To evaluate the discharging property, 2-inch test panels were fabricated. The characteristics of the films were evaluated by SEM, XRD and XPS. In case of adding Gd@sub 2@O@sub 3@, the firing voltage was lower than that of the conventional MgO films by about 17 eV. Also, the firing voltage was reduced by about 19 eV for adding (Ba,Sr,Ca)CO@sub 3@. The interesting results were that the firing voltage had a correlation with the XPS valence band spectra. The firing voltage was reduced as the valence band edge was shifted to lower binding state. It means that the secondary electrons can be ejected more easily and the ejected electrons have more energy. Consequently, the discharging property was improved. @FootnoteText@ @footnote 1@H. Uchiike et al., IEEE Trans. Elec. Dev., ED-23 1211 (1976). @footnote 2@Yasushi Motoyama et al., J. Appl. Phys., 95 (12), 8419 (2004). @footnote 3@ H. D. Hagstrum, Physical Review, 122 (1), 83 (1961) @footnote 4@M. O. Aboelfotoh et al., J. Appl. Phys., 48 (11), 4754 (1977). @footnote 5@T. J. Vink et al., Appl. Phy. Lett., 80 (12), 2216 (2002).