AVS 53rd International Symposium | |
Nanometer-scale Science and Technology | Tuesday Sessions |
Session NS-TuA |
Session: | Nanoscale Devices and Detection |
Presenter: | X. Du, Rutgers University |
Authors: | X. Du, Rutgers University E.Y. Andrei, Rutgers University A.F. Hebard, University of Florida |
Correspondent: | Click to Email |