AVS 53rd International Symposium | |
Nanometer-scale Science and Technology | Tuesday Sessions |
Session NS-TuA |
Session: | Nanoscale Devices and Detection |
Presenter: | Z. Chen, IBM T.J. Watson Research Center |
Authors: | Z. Chen, IBM T.J. Watson Research Center X. Du, Rutgers the State University of NJ M.J. Rooks, IBM T.J. Watson Research Center Ph. Avouris, IBM T.J. Watson Research Center |
Correspondent: | Click to Email |