| AVS 53rd International Symposium | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
| Session NS-TuA |
| Session: | Nanoscale Devices and Detection |
| Presenter: | Z. Chen, IBM T.J. Watson Research Center |
| Authors: | Z. Chen, IBM T.J. Watson Research Center X. Du, Rutgers the State University of NJ M.J. Rooks, IBM T.J. Watson Research Center Ph. Avouris, IBM T.J. Watson Research Center |
| Correspondent: | Click to Email |