AVS 53rd International Symposium
    Magnetic Interfaces and Nanostructures Wednesday Sessions
       Session MI-WeM

Paper MI-WeM3
Magnetic Moment Measurements Using Anisotropic Magnetoresistance

Wednesday, November 15, 2006, 8:40 am, Room 2006

Session: Magnetic Imaging
Presenter: F.C.S. da Silva, University of Colorado at Denver and Health Science Center
Authors: F.C.S. da Silva, University of Colorado at Denver and Health Science Center
S.T. Halloran, National Institute of Standards and Technology
R.R. Owings, National Institute of Standards and Technology
A.B. Kos, National Institute of Standards and Technology
W.C. Uhlig, National Institute of Standards and Technology
J. Unguris, National Institute of Standards and Technology
D.P. Pappas, National Institute of Standards and Technology
Correspondent: Click to Email
The Anisotropic Magnetoresistive (AMR) effect is used to estimate the magnetic moment of thin-film Permalloy discs. The method uses the angular dependence of the AMR to measure the shape anisotropy field of a high aspect ratio (100:1) needle positioned near the disc. The measurement is directly related to the product (saturation magnetization)x(thickness) of the sample via the demagnetizing factor. Uncertainties in the absolute value of the magnetic moment are mainly due to sistematic deviations of magnetization from the single domain state. The AMR results are supported by scanning electron microscopy with polarization analysis, conventional magnetometry measurements, and micromagnetic simulations.