Nanoindentation applications in AFM have been a popular technique for characterizing a wide range of materials. This workshop will discuss the new Asylum Research NanoIndenter for true quantitative measurements. Unlike other commercially-available cantilever-based (AFM), the NanoIndenter drives the indenting tip perpendicular to the sample. Displacement and force are measured with optimized AFM sensors that eliminate inaccuracies present in other systems. This allows for increased sensitivity and resolution and extremely accurate tip characterization. The technology and operation will be discussed and current examples of nanoindenting applications will be presented